Parallax Background

Navigating Beauty and Wonders in AFM Images.
Park Systems Global AFM Image Contest

Sample: Aluminum Alloy

Park Systems 2024 Image Contest

Join Park Systems 2024 Image Contest!

sample img 1
sample img 2
sample img 3
sample img 4
sample img 5

Park Systems is hosting an Atomic Force Microscope (AFM) image contest for Park Systems AFM users. Through this image contest, you can showcase your amazing images and enjoy various benefits. The selected images will be featured in the AFM Image Gallery on the Park Systems website, along with other opportunities to promote your research results.

Awards & Prizes

Get your prizes here

Are you ready to gain your best prizes? Get the best you can!

Judging Panel

Meet Our Esteemed Judging Panel

We are thrilled to introduce the distinguished panel of judges for Park Image Contest 2024. Our judges are leaders and experts in their respective fields, bringing a wealth of knowledge, experience, and a discerning eye to our competition. They are tasked with evaluating the outstanding talents and innovations presented by our participants.



Frédéric Dubreuil

Assoc. Prof. at École Centrale de Lyon

Zhihai Cheng

Professor at Renmin University of China Sangmo Yang

Sangmo Yang

Professor at Sogang University, Korea

Gang Liang

Research Scientist at Rice University

Brooke Beam Massani

Director at The University of Arizona

TBU

Park Systems

Park AFM Scholarship Program

Scholarships for Future Leaders

Park Systems is a leading manufacturer of scientific instruments for nanoscale research, including AFM systems. We aim to support the next generation of trail blazers in nanoscience by encouraging young researchers to share and discuss their work as freely as possible. If you are a graduate student or postdoctoral scholar working in a field that involves nanoscale research, apply for a scholarship from Park System. We are awarding scholarships of up to $500 USD to Park Atomic Force Microscopy (AFM) Scholars who share research performed with a Park AFM with others in the nanoscience community.

Scholarship img

* The total amount to be awarded will depend on a jury evaluation to consider the quality of the proposed research presentation, as well as the venue(s) where it will be presented.

Park AFM Systems

Products & Solutions

Park AFMs share a core suite of cutting-edge technologies, ensuring exceptional performance across all of its products. Their decoupled AFM system architecture for lateral and vertical scanners provides unparalleled accuracy, guaranteeing distortion-free images. True Non-Contact technology preserves both tip and sample integrity while maintaining high-resolution scans. The mechanical and software architecture's user-friendly design streamlines tip and sample loading, ensuring easy access to samples, a rapid tip-to-surface approach, and efficient searches to areas of interest.

fx40 img

Additionally, the integration of Smart Scan, an AI-powered operating system, simplifies the AFM operation, making it effortlessly navigable for novices and experts alike. This amalgamation of advanced features defines the reliability, precision, and ease of use inherent to all Park AFMs.